This I present you an AFM topography image of a furan-based polymer thin film. The film was prepared by spin coating onto SiOx wafers and after preparation it was subjected to thermal annealing to promote crystallization. The AFM shows the development of needle-like crystals on the thin film surface. The features have lengths between 100 – 600 nm and widths (needle diameter) of about 60 nm. This work is part of our collaboration with Dr. Michelina Soccio at the Università di Bologna.
