AFM image of the week


This I present you an AFM topography image of a furan-based polymer thin film. The film was prepared by spin coating onto SiOx wafers and after preparation it was subjected to thermal annealing to promote crystallization. The AFM shows the development of needle-like crystals on the thin film surface. The features have lengths between 100 – 600 nm and widths (needle diameter) of about 60 nm. This work is part of our collaboration with Dr. Michelina Soccio at the Università di Bologna.

Leave a Reply! Don't be shy

Fill in your details below or click an icon to log in: Logo

You are commenting using your account. Log Out /  Change )

Google photo

You are commenting using your Google account. Log Out /  Change )

Twitter picture

You are commenting using your Twitter account. Log Out /  Change )

Facebook photo

You are commenting using your Facebook account. Log Out /  Change )

Connecting to %s

This site uses Akismet to reduce spam. Learn how your comment data is processed.